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Molybdenum X-ray absorption edges from 200 to 20,000 eV: The benefits of soft X-ray spectroscopy for chemical speciation

机译:钼X射线吸收边缘从200到20,000 eV:软X射线光谱学对化学形态的好处

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摘要

We have surveyed the chemical utility of the near-edge structure of molybdenum X-ray absorption edges from the hard X-ray K-edge at 20,000eV down to the soft X-ray M(4,5)-edges at approximately 230eV. We compared, for each edge, the spectra of two tetrahedral anions, MoO(4)(2-) and MoS(4)(2-). We used three criteria for assessing near-edge structure of each edge: (i) the ratio of the observed chemical shift between MoO(4)(2-) and MoS(4)(2-) and the linewidth, (ii) the chemical information from analysis of the near-edge structure and (iii) the ease of measurement using fluorescence detection. Not surprisingly, the K-edge was by far the easiest to measure, but it contained the least information. The L(2,3)-edges, although harder to measure, had benefits with regard to selection rules and chemical speciation in that they had both a greater chemical shift as well as detailed lineshapes which could be theoretically analyzed in terms of Mo ligand field, symmetry, and covalency. The soft X-ray M(2,3)-edges were perhaps the least useful, in that they were difficult to measure using fluorescence detection and had very similar information content to the corresponding L(2,3)-edges. Interestingly, the soft X-ray, low energy ( approximately 230eV) M(4,5)-edges had greatest potential chemical sensitivity and using our high-resolution superconducting tunnel junction (STJ) fluorescence detector they appear to be straightforward to measure. The spectra were amenable to analysis using both the TT-multiplet approach and FEFF. The results using FEFF indicate that the sharp near-edge peaks arise from 3d-->5p transitions, while the broad edge structure has predominately 3d-->4f character. A proper understanding of the dependence of these soft X-ray spectra on ligand field and site geometry is necessary before a complete assessment of the utility of the Mo M(4,5)-edges can be made. This work includes crystallographic characterization of sodium tetrathiomolybdate.
机译:我们已经调查了钼X射线吸收边缘的近边缘结构的化学效用,从20,000eV的硬X射线K边缘到大约230eV的软X射线M(4,5)边缘。我们比较了每个边缘的两个四面体阴离子MoO(4)(2-)和MoS(4)(2-)的光谱。我们使用三个标准来评估每个边缘的近边缘结构:(i)MoO(4)(2-)和MoS(4)(2-)之间观察到的化学位移与线宽的比率,(ii)来自近边缘结构分析的化学信息;以及(iii)使用荧光检测测量的简便性。毫不奇怪,到目前为止,K边缘最容易测量,但包含的信息最少。 L(2,3)边缘虽然较难测量,但在选择规则和化学形态方面具有优势,因为它们既具有较大的化学位移,又具有详细的线形,可以根据Mo配体场进行理论分析,对称和共价。软X射线M(2,3)边缘可能是最不有用的,因为它们难以使用荧光检测进行测量,并且具有与相应的L(2,3)边缘非常相似的信息内容。有趣的是,软X射线,低能量(大约230eV)的M(4,5)边缘具有最大的潜在化学敏感性,使用我们的高分辨率超导隧道结(STJ)荧光检测器,它们似乎很容易测量。光谱适合使用TT多重方法和FEFF进行分析。使用FEFF的结果表明,尖锐的近边缘峰是由3d-> 5p跃迁引起的,而宽边缘结构主要具有3d-> 4f的特征。在对Mo M(4,5)-边缘的效用进行完整评估之前,必须对这些软X射线光谱对配体场和位点几何形状的依赖性有适当的了解。这项工作包括四硫代钼酸钠的晶体学表征。

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